US Patent Issued to INTEL NDTM US on Nov. 4 for "Method of detecting read hotness and degree of randomness in solid-state drives (SSDS)" (Colorado Inventor)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,654, issued on Nov. 4, was assigned to INTEL NDTM US LLC (Santa Clara, Calif.).

"Method of detecting read hotness and degree of randomness in solid-state drives (SSDS)" was invented by Shirish Bahirat (Longmont, Colo.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A request to read data stored in a non-volatile memory (NVM) is processed by incrementing a global read counter for the NVM, incrementing a local read counter for a zone of the NVM being accessed by processing of the read request, computing a degree of read hotness for the zone, computing a read concentration of the zone based at least in part on the degree of read hotness of the zone, the ...