US Patent Issued to INTEL NDTM US on Nov. 11 for "Diagnostic ring oscillator circuit for DC and transient characterization" (California Inventors)

ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,974, issued on Nov. 11, was assigned to INTEL NDTM US LLC (Santa Clara, Calif.).

"Diagnostic ring oscillator circuit for DC and transient characterization" was invented by Andreas Kerber (Pleasanton, Calif.) and Phillip Kliza (Palo Alto, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods and apparatus for a diagnostic in situ ring oscillator (RO) circuit for DC and transient characterization. The RO circuit includes a plurality of symmetrical stages coupled via an RO feedback signal line and forming an inverter chain, where each stage includes a CMOS inverter comprising a pair of pMOS and nMOS transistors coupled between power-gating tran...