US Patent Issued to INTEGRAL GEOMETRY SCIENCE on Dec. 23 for "Scattering tomography device and scattering tomography method" (Japanese Inventors)

ALEXANDRIA, Va., Dec. 23 -- United States Patent no. 12,505,591, issued on Dec. 23, was assigned to INTEGRAL GEOMETRY SCIENCE INC. (Hyogo, Japan).

"Scattering tomography device and scattering tomography method" was invented by Noriaki Kimura (Hyogo, Japan) and Kenjiro Kimura (Hyogo, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A scattering tomography device includes: a transmitting antenna that transmits radio waves into an interior of an object; a receiving antenna that receives, outside the object, scattered waves of the radio waves; and an information processing circuit that obtains measurement results over a plurality of days and generates a reconstructed image showing a persistent element inside...