ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,380,553, issued on Aug. 5, was assigned to Instrumental Inc. (Los Altos, Calif.).
"Method for predicting defects in assembly units" was invented by Samuel Bruce Weiss (Sunnyvale, Calif.), Reilly Hayes (Sunnyvale, Calif.), Spencer Purdy (Sunnyvale, Calif.), Molly McShane (Sunnyvale, Calif.) and Anna-Katrina Shedletsky (Sunnyvale, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "One variation of a method for predicting manufacturing defects includes: accessing a first set of inspection images of a first set of assembly units recorded by an optical inspection station over a first period of time; generating a first set of vectors representing features e...