US Patent Issued to INSTITUTE OF FLEXIBLE ELECTRONICS TECHNOLOGY OF THU, ZHEJIANG on Sept. 16 for "Flexible probe for MicroLED defect detection and manufacturing method therefor" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 17 -- United States Patent no. 12,416,685, issued on Sept. 16, was assigned to INSTITUTE OF FLEXIBLE ELECTRONICS TECHNOLOGY OF THU, ZHEJIANG (Jiaxing, China).

"Flexible probe for MicroLED defect detection and manufacturing method therefor" was invented by Xian Huang (Jiaxing, China) and Qing Yang (Jiaxing, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A flexible probe for microLED defect detection includes: a flexible base and a flexible circuit film layer. The flexible base includes a flexible substrate and flexible protrusions located on the flexible substrate. A circuit for illuminating a microLED to be detected is provided inside the flexible circuit film layer. The flexible...