US Patent Issued to INSTITUTE OF AUTOMATION CHINESE ACADEMY OF SCIENCES on March 18 for "Method for constructing defect detection model, method for detecting defect and related apparatus" (Chinese Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,254,612, issued on March 18, was assigned to INSTITUTE OF AUTOMATION CHINESE ACADEMY OF SCIENCES (Beijing).

"Method for constructing defect detection model, method for detecting defect and related apparatus" was invented by Xian Tao (Beijing), Shichen Qu (Beijing) and Zhen Qu (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure belongs to the field of defect detections and discloses a method for constructing a defect detection model, a method for detecting a defect and a related apparatus, obtaining an initial training image, and adding a simulated anomaly to the initial training image to obtain a simulated anomaly training im...