ALEXANDRIA, Va., June 10 -- United States Patent no. 12,293,506, issued on May 6, was assigned to INOVISION SOFTWARE SOLUTIONS INC. (Chesterfield, Mich.).
"Method to locate defects in e-coat" was invented by Jacob Nathaniel Allen (Shelby Township, Mich.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of locating a defect in an e-coat on a surface can include acquiring an image of the surface. A correction coefficient can be applied to the image to form an adjusted image. The correction coefficient can relate pixel values of the image to a calibration value. The adjusted image can be separated into a spectral component which can be modified by a block average determination to create a modified spectra...