ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,241, issued on May 20, was assigned to Innovatum Instruments Inc. (Los Altos, Calif.).
"Automated probe landing" was invented by Richard E Stallcup II (Frisco, Texas), Michael Berkmyre (Princeton, Texas), Carlo Floresca (Frisco, Texas) and Ronen Benzion (Los Altos, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A nanoprober system can land a probe onto a device under test (DUT) by positioning a conductive probe above the DUT by a motion control device; applying electrical signals between the conductive probe and the DUT; measuring electrical responses from the applied electrical signal; calculating impedance magnitude values and/or phase angl...