US Patent Issued to InnoLux on Feb. 25 for "Electronic device and manufacturing method and inspection method thereof using transmittance of dielectric" (Taiwanese Inventors)

ALEXANDRIA, Va., Feb. 26 -- United States Patent no. 12,237,176, issued on Feb. 25, was assigned to InnoLux Corp. (Miao-Li County, Taiwan).

"Electronic device and manufacturing method and inspection method thereof using transmittance of dielectric" was invented by Kuang-Ming Fan (Miao-Li County, Taiwan), Chia-Lin Yang (Miao-Li County, Taiwan) and Liang-Lu Chen (Miao-Li County, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electronic device includes a conductive layer, a first dielectric layer, and a second dielectric layer, in which the second dielectric layer is disposed on the first dielectric layer, the conductive layer is disposed between the first dielectric layer and the second dielectric la...