US Patent Issued to INNOGRIT TECHNOLOGIES on Dec. 30 for "Method for finding common optimal read reference voltage of multi-dies, storage system" (Chinese Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,512,171, issued on Dec. 30, was assigned to INNOGRIT TECHNOLOGIES Co. LTD. (Shanghai).

"Method for finding common optimal read reference voltage of multi-dies, storage system" was invented by Youngjoon Choi (Shanghai) and Goyo Chiang (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for finding a common optimal read reference voltage of multi-dies and a storage system includes: obtaining voltage distributions of each block in the multi-dies at different read and write temperatures and/or different P/E cycles; determining optimal read reference voltages for all blocks in the multi-dies; obtaining the number of blocks corresponding to diff...