ALEXANDRIA, Va., March 5 -- United States Patent no. 12,241,866, issued on March 4, was assigned to INNEREYE Co. LTD. (Daegu, South Korea).
"Non-destructive inspection method for pouch-type battery" was invented by Baek Young Choi (Daegu, South Korea), Seung Gon Kim (Daegu, South Korea), Sang Moon Koo (Daegu, South Korea) and Jung Won Kim (Daegu, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A non-destructive inspection method of detecting defects in a pouch-type secondary battery is disclosed. The defects are due to a crack or weld condition of an electrode sealed with a pouch. The method is used in a manufacturing process of the pouch-type secondary battery, where the manufacturing process inc...