ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,449,472, issued on Oct. 21, was assigned to Infineon Technologies AG (Neubiberg, Germany).
"Circuit and method for testing a circuit" was invented by Alessio Ciarcia (Munich).
According to the abstract* released by the U.S. Patent & Trademark Office: "According to various embodiments, a circuit is described including a plurality of scan flip-flops including a sequence of input wrapper scan flip-flops and including, for each input wrapper scan flip-flop of at least a subset of the input wrapper scan flip-flops, at the input wrapper scan flip-flop's test input a respective test input circuit configured to, when supplied with a mode control signal having a first value, connect the test ...