ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,893, issued on Oct. 14, was assigned to Infineon Technologies AG (Neubiberg, Germany).
"On-chip reflection coefficient measurement system" was invented by Thomas Obermueller (Linz, Austria), Andreas Schwarz (Opping, Austria), Stefan Herzinger (Sauerlach, Germany), Bernhard Berger (Freistadt, Austria), Stefan Schmalzl (Sauerlach, Germany), Faisal Ahmed (Linz, Austria) and Muhammad Furqan (Linz, Austria).
According to the abstract* released by the U.S. Patent & Trademark Office: "A device may include a receive (Rx) antenna input to couple an Rx antenna to an Rx chain, and a signal coupler to inject the test signal toward the Rx antenna. The device may include an Rx antenna switch t...