ALEXANDRIA, Va., June 12 -- United States Patent no. 12,300,342, issued on May 13, was assigned to Infineon Technologies LLC (San Jose, Calif.).

"System and method for testing a non-volatile memory" was invented by Bogdan Georgescu (Colorado Springs, Colo.), Cristinel Zonte (Colorado Springs, Colo.) and Vijay Raghavan (Driftwood, Colo.).

According to the abstract* released by the U.S. Patent & Trademark Office: "In accordance with an embodiment, a method for characterizing a non-volatile memory, includes: applying a first voltage on a word line conductively coupled to a non-volatile memory cell and measuring a current flowing through the non-volatile memory cell in response to applying the first voltage. Measuring the current includes: us...