US Patent Issued to Infineon Technologies on March 18 for "Circuits and techniques for predicting failure of circuits based on stress origination metrics and stress victim events" (German, Austrian Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,254,254, issued on March 18, was assigned to Infineon Technologies AG (Neubiberg, Germany).

"Circuits and techniques for predicting failure of circuits based on stress origination metrics and stress victim events" was invented by Veit Kleeberger (Munich), Rafael Zalman (Markt Schwaben, Germany), Georg Georgakos (Erding, Germany), Dirk Hammerschmidt (Villach, Austria), Bernhard Gstoettenbauer (Engerwitzdorf, Austria), Ludwig Rossmeier (Dorfen, Germany) and Thomas Zettler (Hoehenkirchen-Siegertsbrunn, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "In some examples, a method of operating a circuit is described. The method may include performing a ...