ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,525,853, issued on Jan. 13, was assigned to Infineon Technologies AG (Neubiberg, Germany).
"Synchronous sampling" was invented by Georg Kaffl (Prutting, Germany) and Benjamin Kollmitzer (Portschach am Worther See, Austria).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system may include a first sensor and a second sensor. The second sensor may be configured to receive a trigger associated with synchronizing sampling of a second sensor signal with sampling of a first sensor signal associated with the first sensor. The second sensor may be configured to obtain a second sample associated with a second sensor signal based on the trigger, wherein the secon...