ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,379,411, issued on Aug. 5, was assigned to Infineon Technologies AG (Neubiberg, Germany).
"Circuit and method for testing a circuit" was invented by Alessio Ciarcia (Munich).
According to the abstract* released by the U.S. Patent & Trademark Office: "According to various embodiments, a circuit is described including a plurality of scan flip-flops including a sequence of scan flip-flops, wherein at least some scan flip-flops of the sequence are wrapper scan flip-flops, and including, for each scan flip-flop of at least a subset of the scan flip-flops, at the wrapper scan flip-flop's test input a respective test input circuit configured to, when supplied with a mode control signal havin...