US Patent Issued to Infineon Technologies on April 22 for "Apparatus for testing semiconductor devices and a rolling contactor for use in such an apparatus" (Malaysian Inventors)

ALEXANDRIA, Va., June 6 -- United States Patent no. 12,282,060, issued on April 22, was assigned to Infineon Technologies AG (Neubiberg, Germany).

"Apparatus for testing semiconductor devices and a rolling contactor for use in such an apparatus" was invented by Nee Wan Khoo (Melaka, Malaysia) and Soon Lai Kho (Melaka, Malaysia).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus for testing semiconductor devices is disclosed. In one example, the apparatus includes a rolling contactor comprising a first cylindrical rotatable holder, a plurality of test pin sets, each one of the test pin sets being connected to the cylindrical rotatable holder. Each one of the test pin sets comprises a plurality of test...