US Patent Issued to Infineon Technologies Canada on Nov. 4 for "Automatic maverick wafer screening using die pass pattern" (Canadian Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,042, issued on Nov. 4, was assigned to Infineon Technologies Canada Inc. (Ottawa).

"Automatic maverick wafer screening using die pass pattern" was invented by Iman Abdali Mashhadi (Kanata, Canada), Regina Inyangat Akudo (Kanata, Canada) and Syed Faizan-ul-Haq Gilani (Stittsville, Canada).

According to the abstract* released by the U.S. Patent & Trademark Office: "Automatic maverick screening of a subject wafer. An inspection pass status is acquired for each of multiple die on a subject wafer. For each of multiple zones of the subject wafer, a pass/fail percentage of the dies within the corresponding zone is compared with an expected pass/fail percentage for the corresponding zone....