US Patent Issued to INFINEON TECHNOLOGIES AUSTRIA on May 20 for "Gate charge and leakage measurement test sequence for solid state devices" (Austrian Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,240, issued on May 20, was assigned to INFINEON TECHNOLOGIES AUSTRIA AG (Villach, Austria).

"Gate charge and leakage measurement test sequence for solid state devices" was invented by Leo Aichriedler (Puch, Austria) and Gerald Wriessnegger (Villach, Austria).

According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus comprises a switch and a capacitor connected to the switch and to a gate driver that drives a gate of a solid state device. The gate driver is operated to perform a test sequence for the solid state device. The test sequence includes turning on a switch and charging a capacitor to a supply voltage during an initial phase. During a first ...