US Patent Issued to INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE on Nov. 11 for "Laser measurement calibration method" (Taiwanese Inventors)

ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,468,022, issued on Nov. 11, was assigned to INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE (Hsinchu, Taiwan).

"Laser measurement calibration method" was invented by Shih-Tsung Liu (Hsinchu, Taiwan) and Yen-Hsien Lee (Taoyuan, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A laser measurement calibration method is adapted to establish in a software program and executes the following steps after read by a computer: measuring a standard calibration element with a contact sensing device to obtain a measurement value; measuring the standard calibration element with at least one non-contact sensing device to obtain at least one surface distance value of the ...