ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,530,012, issued on Jan. 20, was assigned to INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE (Hsinchu, Taiwan).

"Mold state monitoring system and method thereof" was invented by Yu-Hung Pai (Hsinchu, Taiwan), Hung-Tsai Wu (Hsinchu, Taiwan), He-Chen Liao (Hsinchu, Taiwan) and Kai-Jhih Yang (Hsinchu, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A mold state monitoring system is provided, and the monitoring method thereof is: dividing multiple processing signals of a mold into initial state information and wear state information, so as to obtain a target model and a wear threshold based on the initial state information, and input the wear state informatio...