US Patent Issued to INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE on Aug. 12 for "Common path interferometric probe" (Taiwanese Inventors)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,386,121, issued on Aug. 12, was assigned to INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE (Hsinchu, Taiwan).

"Common path interferometric probe" was invented by Yuan Chin Lee (Hsinchu, Taiwan) and Chi Shen Chang (Zhubei, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A common path interferometric probe for identifying a sample includes an optical fiber, a light guide component, a GRIN lens component and a beamsplitter surface. The optical fiber outputs a light beam. The optical fiber, the light guide component and the GRIN lens component are sequentially connected. The reflection surface is disposed on the light guide component and the beamsplitter su...