ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,468,034, issued on Nov. 11, was assigned to Imec vzw (Leuven, Belgium) and Universiteit Gent (Ghent, Belgium).
"Phase difference detection system and a method for detecting a phase difference" was invented by YanLu Li (Kessel-Lo, Belgium) and Roeland Baets (Deinze, Belgium).
According to the abstract* released by the U.S. Patent & Trademark Office: "Example embodiments relate to phase difference detection systems and method for detecting phase difference. One embodiment includes a phase difference detection system for a single target location. The system includes a laser source to generate a laser beam. The system also includes a phase difference detector coupled to the laser source ...