US Patent Issued to IMEC VZW, UNIVERSITEIT ANTWERPEN on Nov. 18 for "Phase-contrast X-ray imaging system for obtaining a dark-field image and a method therefor" (Belgian Inventors)

ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,471,862, issued on Nov. 18, was assigned to IMEC VZW (Leuven, Belgium) and UNIVERSITEIT ANTWERPEN (Antwerp, Belgium).

"Phase-contrast X-ray imaging system for obtaining a dark-field image and a method therefor" was invented by Jan De Beenhouwer (Geraardsbergen, Belgium) and Jan Sijbers (Duffel, Belgium).

According to the abstract* released by the U.S. Patent & Trademark Office: "A computer-implemented method for obtaining dark-field X-ray projection data of an object includes: obtaining a first set of X-ray projection data of the object at a first energy spectrum; the first set of X-ray projection data having a first attenuation component, a first phase component, and a first dark-fi...