ALEXANDRIA, Va., March 26 -- United States Patent no. 12,260,935, issued on March 25, was assigned to Illumina Inc. (San Diego).
"Limit of detection based quality control metric" was invented by Sarah L. Kinnings (San Diego), Cosmin Deciu (San Diego), Badri Padhukasahasram (San Jose, Calif.) and Dimitri Skvortsov (Orinda, Calif.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are methods and systems for sample quality control in CNV detection using test samples comprising cell-free nucleic acid fragments originating from a mother and a fetus. The method involves determining an exclusion region defined by at least a fetal fraction limit of detection (LOD) curve. The fetal fraction LOD curve varies wit...