ALEXANDRIA, Va., March 19 -- United States Patent no. 12,254,695, issued on March 18, was assigned to IHI Corp. (Tokyo).
"Foreign matter detection system" was invented by Kenichi Hamaguchi (Tokyo), Hiroaki Imaizumi (Tokyo), Jingyu Hu (Tokyo), Takanori Nishimura (Tokyo) and Kenichi Nakamura (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are an image capturing device for capturing an image in a target area, transmission parts through which an outside can be visually observed from inside of the target area and polarizing filters on an light path from the transmission parts to the image capturing device. The front- and depth-side polarizing filters relative to the image capturing device are arran...