US Patent Issued to I-SENS on Oct. 28 for "Method for processing noise of biometric information measurement data" (South Korean Inventors)

ALEXANDRIA, Va., Oct. 28 -- United States Patent no. 12,453,517, issued on Oct. 28, was assigned to I-SENS INC. (Seoul, South Korea).

"Method for processing noise of biometric information measurement data" was invented by David Lee (Seoul, South Korea), Young Jea Kang (Seoul, South Korea), Ji Seon Nah (Seoul, South Korea), Jung Hee Seo (Seoul, South Korea) and Hak Hyun Nam (Seoul, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure relates to a method for processing noise in biometric information measurement data, wherein the method for processing noise in biometric information measurement data, according to one embodiment of the present invention, may comprise the steps of: mea...