US Patent Issued to Hyundai Motor, Kia, Korea Institute of Science and Technology on July 22 for "Sample holder for X-ray diffraction analysis and x-ray diffraction analysis method using the same" (South Korean Inventors)

ALEXANDRIA, Va., July 23 -- United States Patent no. 12,366,541, issued on July 22, was assigned to Hyundai Motor Co. (Seoul, South Korea), Kia Corp. (Seoul, South Korea) and Korea Institute of Science and Technology (Seoul, South Korea).

"Sample holder for X-ray diffraction analysis and x-ray diffraction analysis method using the same" was invented by Yun Sung Kim (Gyeonggi-do, South Korea), Yoon Kwang Lee (Gyeonggi-do, South Korea), Ga Hyeon Im (Gyeonggi-do, South Korea), Sang Heon Lee (Gyeonggi-do, South Korea), Kyu Joon Lee (Seoul, South Korea), Jae Pyoung Ahn (Seoul, South Korea), Hae Ryoung Kim (Seoul, South Korea), Hyun Woo Gong (Seoul, South Korea) and Byeong Hyeon Lee (Seoul, South Korea).

According to the abstract* released by t...