ALEXANDRIA, Va., June 6 -- United States Patent no. 12,283,039, issued on April 22, was assigned to HYUNDAI MOBIS Co. LTD. (Seoul, South Korea).

"Method and system for defect inspection based on deep learning" was invented by Tae Hyun Kim (Seoul, South Korea), Hye Rin Kim (Yongin-si, South Korea) and Yeong Jun Cho (Gwangju, South Korea).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure in some embodiments provides a product inspection method and a system based on deep learning for detecting a product defect. The present disclosure provides a product inspection method and system for detecting product defects by linking a predeveloped deep learning-based classification model to interwork wit...