US Patent Issued to Hynetek Semiconductor on May 27 for "Fault detection circuit, method and power adapter" (Chinese Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,671, issued on May 27, was assigned to Hynetek Semiconductor Co. Ltd. (Shenzhen, China).

"Fault detection circuit, method and power adapter" was invented by Renjian Xie (Shenzhen, China) and Yingyang Ou (Shenzhen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "An fault detection circuit includes a first comparison unit, a second comparison unit, an impedance unit and a digital control unit, the first comparison unit is configured to output a first judgment signal based on the voltage across a sampling resistor; the second comparison unit is configured to output a second judgment signal based on the voltage across the impedance unit, or the sec...