ALEXANDRIA, Va., July 16 -- United States Patent no. 12,361,546, issued on July 15, was assigned to HUVITZ Co. LTD. (Anyang-si, South Korea).
"Method for measuring retinal layer in OCT image" was invented by Hyoung Uk Kim (Anyang-si, South Korea) and Gu Yong Kim (Anyang-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method of measuring a retinal layer includes obtaining an OCT layer image of a retina, detecting a reference boundary line indicating a retinal layer in the obtained OCT image, obtaining an aligned OCT image by aligning a vertical position of each column of the OCT image so that the detected reference boundary line becomes a baseline, predicting retinal layer regions from the al...