US Patent Issued to Hunan University on Sept. 23 for "Neural network-based defect detection method for gluing quality on aircraft skin" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,423,796, issued on Sept. 23, was assigned to Hunan University (Changsha, China).

"Neural network-based defect detection method for gluing quality on aircraft skin" was invented by Jianxu Mao (Changsha, China), Junfei Yi (Changsha, China), Yaonan Wang (Changsha, China), Hui Zhang (Changsha, China), Kai Zeng (Changsha, China), Ziming Tao (Changsha, China), He Xie (Changsha, China), Caiping Liu (Changsha, China), Qing Zhu (Changsha, China), Min Liu (Changsha, China) and Xian'en Zhou (Changsha, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed in the present invention is a neural network-based defect detection method for gluing quality on airc...