US Patent Issued to HUNAN UNIVERSITY on May 20 for "Method and device for labeling transient voltage stability samples in power grid based on semi-supervised learning" (Chinese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,307,378, issued on May 20, was assigned to HUNAN UNIVERSITY (Changsha, China).

"Method and device for labeling transient voltage stability samples in power grid based on semi-supervised learning" was invented by Lipeng Zhu (Changsha, China), Weijia Wen (Changsha, China), Weizhi Huang (Changsha, China), Zhikang Shuai (Changsha, China), Jiayong Li (Changsha, China), Cong Zhang (Changsha, China), Bin Zhou (Changsha, China) and Jie Hou (Changsha, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and device for labeling transient voltage stability samples in a power grid based on semi-supervised learning are provided. The method includes: S1: obt...