US Patent Issued to HUNAN UNIVERSITY on Dec. 30 for "Method and apparatus for single-pixel thermal imaging detection of surface and internal defects of material" (Chinese Inventors)

ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,513,376, issued on Dec. 30, was assigned to HUNAN UNIVERSITY (Changsha, China).

"Method and apparatus for single-pixel thermal imaging detection of surface and internal defects of material" was invented by Hongjin Wang (Changsha, China), Yunze He (Changsha, China), Xiang Li (Changsha, China), Baoyuan Deng (Changsha, China) and Yaonan Wang (Changsha, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a method and apparatus for single-pixel thermal imaging detection of surface and internal defects of a material. The laser module is configured to generate uniform laser light. The spatial light modulation module is configured to spatially enc...