US Patent Issued to Hubei University on May 20 for "Surface defect detection method, system, equipment, and terminal thereof" (Chinese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,307,653, issued on May 20, was assigned to Hubei University (Wuhan, China).

"Surface defect detection method, system, equipment, and terminal thereof" was invented by Kansong Chen (Wuhan, China), Zhihao Xi (Wuhan, China), Zuyang Liu (Wuhan, China) and Yanyu Chen (Wuhan, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosure discloses a surface defect detection method, system, equipment, and terminal, comprising: S1, LBP operator: before comparing the benchmark image with the actual shot image, a LBP texture feature extraction algorithm is first used for pre-processing; S2, Sift feature-point matching: adding a Sift feature-point matching al...