US Patent Issued to HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY on Sept. 9 for "Method for ptychography position correction based on probe weighting" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,411,328, issued on Sept. 9, was assigned to HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY (Hubei, China).

"Method for ptychography position correction based on probe weighting" was invented by Honggang Gu (Hubei, China), Lei Zhong (Hubei, China), Shiyuan Liu (Hubei, China) and Li Liu (Hubei, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosure provides a method for ptychography position correction based on probe weighting. The method includes: collecting diffraction light field intensity information and simultaneously initializing information functions of illumination probes and a sample to be tested and probe positions; obtaining and im...