ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,549,990, issued on Feb. 10, was assigned to Huawei Technologies Co. Ltd. (Shenzhen, China).

"Measurement method and apparatus" was invented by Li Zhang (Beijing), Jing Han (Beijing), Hong Li (Beijing) and Zhongyi Shen (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "A terminal determines whether a measurement gap type corresponding to a first group of MOs is an MG or an NCSG, measures the first group of MOs based on the measurement gap type corresponding to the first group of MOs, and determines a data transmission behavior in a serving cell of the terminal based on the measurement gap type corresponding to the first group of MOs."

The patent wa...