US Patent Issued to Huawei Technologies'Co., 'Ltd.' on May 27 for "Automatic test pattern generation-based circuit verification method and apparatus" (Chinese Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,680, issued on May 27, was assigned to Huawei Technologies'Co.'Ltd.' (Shenzhen, China).

"Automatic test pattern generation-based circuit verification method and apparatus" was invented by Huiling Zhen (Hong Kong), Miaohui Chen (Shenzhen, China), Mingxuan Yuan (Hong Kong), Naixing Wang (Shenzhen, China), Wanqian Luo (Chengdu, China) and Yu Huang (Shenzhen, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "An automatic test pattern generation-based circuit verification method, comprises determining a to-be-detected first logic cone from a fan-out logic cone corresponding to the target line; determining, based on the first logic cone, a to-be-detect...