US Patent Issued to HUA YANG Precision Machinery on March 18 for "Detection method and system for determining the location of a surface defect on a front or back surface of a transparent film" (Taiwanese Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,253,474, issued on March 18, was assigned to HUA YANG Precision Machinery Co. Ltd (Tainan, Taiwan).

"Detection method and system for determining the location of a surface defect on a front or back surface of a transparent film" was invented by Hsien-Te Hsiao (Tainan, Taiwan) and Hsuan-Fu Wang (Tainan, Taiwan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method and system for detecting the location of a surface defect on a transparent film with respect to whether the surface defect is at a front or back surface of the film. By illuminating the surface defect with a light source from an oblique angle and capturing an image of the surface defect using ...