ALEXANDRIA, Va., March 12 -- United States Patent no. 12,245,814, issued on March 11, was assigned to HOYA LENS THAILAND LTD. (Pathumthani, Thailand).
"Refraction measuring apparatus" was invented by Takashi Iizuka (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A refraction measuring apparatus measures refractive properties of an eye by two light bundles respectively passing through two apertures, the apparatus including: a first rotational member, rotatably supported about a first rotational center, provided with the two apertures on either side of the first rotational center; a second rotational member, rotatably supported about a second rotational center, provided with a light-transmission portion(...