ALEXANDRIA, Va., June 6 -- United States Patent no. 12,279,821, issued on April 22, was assigned to HOYA LENS THAILAND LTD. (Pathumthani, Thailand).
"Refractive property measurement device, measurement tool, and refractive property measurement method" was invented by Takashi Iizuka (Tokyo).
According to the abstract* released by the U.S. Patent & Trademark Office: "A refractive property measurement apparatus to measure refractive properties of an eye includes: a disk provided with a first pinhole and a second pinhole that transmit light rays while narrowing them; a light emitting unit that emits a first light ray and a second light ray from different positions on a surface of the disk, so that light rays passed through the first pinhole a...