US Patent Issued to Horizon Journey (Hangzhou) Artificial Intelligence Technology on June 10 for "Test circuit, method, and apparatus for to-be-tested module" (Chinese Inventors)

ALEXANDRIA, Va., June 18 -- United States Patent no. 12,326,791, issued on June 10, was assigned to Horizon Journey (Hangzhou) Artificial Intelligence Technology Co. Ltd. (ZheJiang, China).

"Test circuit, method, and apparatus for to-be-tested module" was invented by Jing Li (Zhejiang, China), Yi Zhou (Zhejiang, China), Luyang Zhang (Zhejiang, China) and Wenxing Li (Zhejiang, China).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are a test circuit, method, and apparatus for a to-be-tested module. The circuit includes a test data generation module including a plurality of test data generation units, each of which is configured to generate test data consistent with a data type supported by itself base...