US Patent Issued to Horizon (Shanghai) Artificial Intelligence Technology on Sept. 9 for "Circuit, method, and apparatus for diagnosing a fault, and computer readable storage medium" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,411,176, issued on Sept. 9, was assigned to Horizon (Shanghai) Artificial Intelligence Technology Co. Ltd. (Shanghai).

"Circuit, method, and apparatus for diagnosing a fault, and computer readable storage medium" was invented by Zheng Wu (Shanghai), Wenxing Li (Shanghai), Yi Zhou (Shanghai), Jing Li (Shanghai) and Qingyu Liu (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "Disclosed are a fault diagnosis circuit, method and apparatus, and computer readable storage medium. The fault diagnosis circuit includes a safety protection circuit electrically connected to a protected circuit and a diagnosis module electrically connected to the safety prot...