ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,429,420, issued on Sept. 30, was assigned to HORIBA STEC Co. LTD. (Kyoto, Japan).
"Gas analysis apparatus and gas analysis method" was invented by Motonobu Takahashi (Kyoto, Japan), Sotaro Kishida (Kyoto, Japan), Akira Kuwahara (Kyoto, Japan), Takeshi Akamatsu (Kyoto, Japan), Yuhei Sakaguchi (Kyoto, Japan) and Masakazu Minami (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are a gas cell into which a gas is introduced, a temperature control block configured to control a temperature of the gas cell, and a pressure sensor configured to measure a pressure inside the gas cell. The pressure sensor is built into the temperature control ...