US Patent Issued to HORIBA STEC on June 17 for "Optical measurement cell, optical analyzer, window forming member, and method of manufacturing optical measurement cell" (Japanese Inventors)

ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,175, issued on June 17, was assigned to HORIBA STEC Co. LTD. (Kyoto, Japan).

"Optical measurement cell, optical analyzer, window forming member, and method of manufacturing optical measurement cell" was invented by Yoshiaki Nakata (Kyoto, Japan), Masakazu Minami (Kyoto, Japan), Yuhei Sakaguchi (Kyoto, Japan), Toru Shimizu (Kyoto, Japan) and Takeshi Akamatsu (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "In order to prevent cracking of a window material in manufacturing an optical measurement cell that satisfies various performances required for airtightness, heat resistance, and the like by atomic diffusion bonding, an optical measurem...