US Patent Issued to HORIBA on Nov. 11 for "Element analysis method, element analysis device, and non-transitory computer readable medium storing program for element analysis device" (Japanese Inventors)

ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,912, issued on Nov. 11, was assigned to HORIBA LTD. (Kyoto, Japan).

"Element analysis method, element analysis device, and non-transitory computer readable medium storing program for element analysis device" was invented by Takahito Inoue (Kyoto, Japan) and Hiroshi Uchihara (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An element analysis method is capable of maintaining accuracy of zero-point correction equivalent to that in the related art while shortening the time required for element analysis. The method includes heating a sample placed in a crucible in a heating furnace, and measuring an amount of an element contained in a gas di...