US Patent Issued to Horiba on May 13 for "Analysis device, program for analysis device, and analysis method" (Japanese Inventor)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,232, issued on May 13, was assigned to Horiba Ltd. (Japan).

"Analysis device, program for analysis device, and analysis method" was invented by Kyoji Shibuya (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The invention is for measuring the concentration of a target component accurately, and is an analysis device that analyzes a target component included in a sample. The analysis device includes a light source that outputs the reference light toward the sample, a photodetector that detects an intensity of sample light that is the reference light having transmitted through the sample, a parameter determining unit that determines a parame...