US Patent Issued to HORIBA on March 18 for "Elemental analysis device for analyzing test sample having cleaning gas supply mechanism" (Japanese Inventors)

ALEXANDRIA, Va., March 19 -- United States Patent no. 12,253,443, issued on March 18, was assigned to HORIBA LTD. (Kyoto, Japan).

"Elemental analysis device for analyzing test sample having cleaning gas supply mechanism" was invented by Takahito Inoue (Kyoto, Japan) and Hiroshi Uchihara (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An elemental analysis device includes a heating furnace in which a test sample that is placed in a crucible is heated so that a sample gas is generated from the test sample, an inflow path through which a carrier gas is introduced into the heating furnace, an outflow path through which a mixture gas made up of the carrier gas and the sample gas is led out from the h...