US Patent Issued to HORIBA on July 8 for "Particle group characteristic measurement device, particle group characteristic measurement method, storage medium recording program for particle group characteristic measurement device, particle diameter distribution measurement device, and particle diameter distribution measurement method" (Japanese Inventors)

ALEXANDRIA, Va., July 9 -- United States Patent no. 12,352,676, issued on July 8, was assigned to HORIBA LTD. (Kyoto, Japan).

"Particle group characteristic measurement device, particle group characteristic measurement method, storage medium recording program for particle group characteristic measurement device, particle diameter distribution measurement device, and particle diameter distribution measurement method" was invented by Yasuhiro Tatewaki (Kyoto, Japan) and Shingo Fujiwara (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A particle group characteristic measurement device includes an image acquisition portion that acquires images of a particle group, a particle information extraction po...